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US 2021/0172976 A1Published application
Phase-shift-based amplitude detector for a high-speed atomic force microscope
AssigneeCornell University
InventorsAtsushi Miyagi, Simon Scheuring
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Abstract
An atomic force microscope includes a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion by square-rooting a signal having a value substantially equal to a sum of a square of the received signal and a squared and phase-shifted version of the received signal. The aforementioned processing, in some implementations is implemented using analog circuit components.
Claims19
An atomic force microscope, having
- a cantilever operating in amplitude modulation mode, and
- a controller including at least one processor configured to:
- receive an input signal indicative of motion of the cantilever,
- calculate a resultant amplitude signal by square-rooting a signal having a value substantially equal to a sum of a square of the input signal and a squared and phase-shifted version of the input signal, and
- output the resultant amplitude signal.
2 more elements
A method of amplitude detection of an atomic force microscope, comprising:
- receiving a first signal indicative of motion of a tip of a cantilever in response to scanning of the tip over the surface of a sample while the cantilever is being driven at a resonant frequency of the cantilever in amplitude modulation mode,
- calculate a resultant amplitude signal by square-rooting a signal having a value equal to a sum of a square of the first signal and a squared and phase-shifted version of the first signal, and
- outputting the resultant amplitude signal.
Dependencies are inferred from the claim text.