Copper wiring surface protective liquid and method for manufacturing semiconductor circuit
AssigneeMitsubishi Gas Chemical Company, Inc.
InventorsKenji Yamada, Kenji Shimada, Hiroshi Matsunaga
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AssigneeMitsubishi Gas Chemical Company, Inc.
InventorsKenji Yamada, Kenji Shimada, Hiroshi Matsunaga
Estimating the term…
A copper wiring material surface protective liquid for production of a semiconductor device is provided, containing an oxyalkylene adduct of an acetylenediol containing an acetylenediol having an oxyalkylene having 2 or 3 carbon atoms added thereto. A method for producing a semiconductor circuit device is provided, containing: forming an insulating film and/or a diffusion preventing film on a silicon substrate; then forming a copper film by a sputtering method; then forming a copper wiring containing 80% by mass or more of copper thereon by a plating method; and flattening the wiring by a chemical mechanical polishing (CMP) method, thereby providing a semiconductor substrate containing a copper wiring, the semiconductor substrate having an exposed surface of a copper wiring material being treated by making in contact with the copper wiring material surface protective liquid.
A copper wiring material surface protective liquid comprising an oxyalkylene adduct of an acetylenediol comprising an acetylenediol having an oxyalkylene having 2 or 3 carbon atoms added thereto.
Dependencies are inferred from the claim text.