Plasma processing apparatus
AssigneeHitachi High-Technologies Corporation
InventorsKenetsu Yokogawa, Takamasa Ichino, Kazuyuki Hirozane, Tadamitsu Kanekiyo
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Technologies Corporation
InventorsKenetsu Yokogawa, Takamasa Ichino, Kazuyuki Hirozane, Tadamitsu Kanekiyo
Estimating the term…
A plasma processing apparatus includes a vacuum chamber, a sample table that places the sample in the vacuum chamber, and a gas supply unit faced to the sample table and having a gas supply surface with a diameter larger than that of the sample, wherein gas injection holes each having identical diameter are provided concentrically on the gas supply surface, a hole number density of the gas injection holes present in an outer diameter position of the sample or in an outside of the outer diameter position is made higher than that of the gas injection holes present inside the outer diameter position of the sample, and a diameter of the gas injection holes present in the outer diameter position of the sample or in the outside from the outer diameter position is larger than that of the gas injection holes present inside the diameter of the sample.
A plasma processing apparatus for applying a surface processing to a sample, comprising:
A plasma processing apparatus for applying a surface processing to a sample, comprising:
Dependencies are inferred from the claim text.