Test Pattern Based Process Model Calibration
AssigneeInternational Business Machines Corporation
InventorsScott M. Mansfield, Geng Han, Jason E. Meiring, Dario Gil
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AssigneeInternational Business Machines Corporation
InventorsScott M. Mansfield, Geng Han, Jason E. Meiring, Dario Gil
Estimating the term…
Embodiments of the present invention provide a method for performing lumped-process model calibration. The method includes creating a plurality of sub-process models for a set of sub-processes; creating a lumped-process-model incorporating said set of sub-processes; calculating a first set of output patterns from a set of test patterns by using said plurality of sub-process models; calculating a second set of output patterns from said set of test patterns by using said lumped-process-model; and adjusting process parameters used in said lumped-process-model to calculate said second set of output patterns to match said first set of output patterns. A computer system for performing the lumped-process model calibration is also provided.
A method comprising:
A system for performing process model calibration, the system comprising:
A machine-readable medium having stored thereon a set of instructions that, when executed by a machine, result in
Dependencies are inferred from the claim text.