Ic layout parsing for multiple masks
AssigneeMentor Graphics Corporation
InventorsAlexander Tritchkov, Emile Y. Sahouria, Le Hong
Life of this patent
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AssigneeMentor Graphics Corporation
InventorsAlexander Tritchkov, Emile Y. Sahouria, Le Hong
Estimating the term…
A method for separating features in a target layout into different mask layouts for use in a photolithographic process. Features of a target layer are searched for features having a predefined shape. In one embodiment, portions of the feature having the predefined shape divided into two or more sub-features and at least one sub-feature are not considered when separating the features into two or more mask layouts. In another embodiment, features having a predefined shape are cut to form two or more sub-features and all features and sub-features are considered when separating the features of the target layout into the two or more mask layouts.
A method of preparing layout data with a computer to create two or more mask layouts that produce a target pattern of features with a photolithographic process, comprising:
A method of preparing layout data with a computer to create two or more mask layouts that produce a target pattern of features with a photolithographic process, comprising:
Dependencies are inferred from the claim text.