Transistor integrated circuit device and manufacturing method thereof

Abstract

There are provided a transistor integrated circuit device which reduces the integrated area of a circuit while avoiding an element destruction caused by thermal runaway, and a method of manufacturing the transistor integrated circuit device. A cut capacitor (13) is composed of an upper electrode formed from a wiring metal and in a first layer; and a lower electrode formed from a wiring metal and in a second layer. A bias resistor (12) is formed from the same wiring metal as that of the lower electrode of the cut capacitor (13). This bias resistor (12) is formed from a wiring metal which is made into a thin film to function as a sheet resistor, and the resistance value of the bias resistor (12) can be freely set according to the thickness or width of the wiring metal.

Dependencies are inferred from the claim text.