Alignment system, alignment method, and lithographic apparatus
AssigneeASML Netherlands B.V.
InventorDirk-Jan Bijvoet
Life of this patent
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AssigneeASML Netherlands B.V.
InventorDirk-Jan Bijvoet
Estimating the term…
A system and a method for aligning two devices with respect to each other are presented. A first of the devices is provided with a proximity switch and the second of the two devices may be provided with a reference mark. When the other device enters a detection area of the proximity switch, a first state of the proximity switch changes to a second state. Thus, the transition from the first state to the second state is a measure of a position of the second device with respect to the proximity switch. When the position of the second device is known with respect to the proximity switch, the devices may be positioned to a desired position with respect to each other. The proximity switch may be used to determine the position of the other device in a number of directions. Both the position and the orientation, i.e. rotation, of the first device with respect to the second device may be determined using the proximity switch.
A lithographic apparatus comprising:
An alignment system configured to align two devices with respect to each other in at least two directions, the alignment system comprising:
A method for aligning two devices with respect to each other in at least two directions, a first of said two devices being provided with a proximity switch, the method comprising:
Dependencies are inferred from the claim text.