Method and apparatus for accessing internal nodes of an integrated circuit using ic package substrate
AssigneeNPTest, LLC
InventorKenneth Wilsher
Life of this patent
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AssigneeNPTest, LLC
InventorKenneth Wilsher
Estimating the term…
A method and apparatus for accessing internal nodes of an integrated circuit using a package substrate are provided. Embodiments of the present invention include an integrated circuit comprising an integrated circuit die comprising a principal side; a conductive element formed on the principal side of the integrated circuit die; a package substrate comprising a principal side facing the principal side of the integrated circuit die; a conductive element located on the principal side of the package substrate; a transmission path wherein a first end of the transmission path is coupled to the conductive element of the integrated circuit die and wherein a second end of the transmission path is coupled to the conductive element of the package substrate.
1) An integrated circuit comprising:
13) An integrated circuit comprising:
23) A method for testing an integrated circuit comprising:
Dependencies are inferred from the claim text.