Semiconductor device and method for manufacturing the same
AssigneeFujitsu Limited
InventorsHidekazu Sato, Toshihiro Wakabayashi
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AssigneeFujitsu Limited
InventorsHidekazu Sato, Toshihiro Wakabayashi
Estimating the term…
By a non-selective epitaxial growth method, an SiGe film is grown on the whole surface of a silicon oxide film so as to cover an inner wall of a base opening. Here, such film forming conditions are selected that, inside the base opening, a bottom portion is formed of single crystal, other portions such as a sidewall portion are formed of polycrystalline, and a film thickness of the sidewall portion is less than or equal to 1.5 times the film thickness of the bottom portion. In this nonselective epitaxial growth, monosilane, hydrogen, diborane, and germane are used as source gases. Then, flow rates of monosilane and hydrogen are set to 20 sccm and 20 slm respectively. Also, a growth temperature is set to 650° C., a flow rate of diborane is set to 75 sccm, and a flow rate of germane is set to 35 sccm.
A semiconductor device, comprising:
A semiconductor device, comprising:
A method for manufacturing a semiconductor device having a bipolar transistor, comprising the steps of:
A method for manufacturing a semiconductor device having a bipolar transistor, comprising the steps of:
Dependencies are inferred from the claim text.