Semiconductor device and manufacturing method of the same
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTeruhito Ohnishi, Takeshi Takagi, Akira Asai, Taizo Fujii, Mitsuo Sugiura, Yoshihisa Minami
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTeruhito Ohnishi, Takeshi Takagi, Akira Asai, Taizo Fujii, Mitsuo Sugiura, Yoshihisa Minami
Estimating the term…
A variable capacitor includes an N+ layer including a variable capacitance region, a P+ layer epitaxially grown on the N+ layer and formed from a SiGe film and a Si film, and a P-type electrode. An NPN-HBT (Hetero-junction Bipolar Transistor) includes a collector diffusion layer formed simultaneously with the N+ layer of the variable capacitor, a collector layer, and a Si/SiGe layer epitaxially grown simultaneously with the P+ layer of the variable capacitor. Since a depletion layer formed in a PN junction of the variable capacitor can extend entirely across the N+ layer, reduction in variation range of the capacitance can be suppressed.
A semiconductor device including
A method for manufacturing a semiconductor device including a variable capacitor and a bipolar transistor on a common semiconductor substrate, comprising the steps of:
Dependencies are inferred from the claim text.