US 2003/0209733 A1Published application

Semiconductor integrated circuit having high-density base cell array

AssigneeFujitsu Limited

InventorsYoshio Kajii, Toru Osajima

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Abstract

A base cell is configured such that P-type regions 11 to 13 are arrayed in a column direction in an N-type well 10, N-type regions 21 to 23 are arrayed in a column direction in a P-type well 20 next to the N-type well, gate lines 34A and 35B passing above a channel between the P-type regions and further between the N-type regions are formed in a row direction, and well contact regions 16C and 26C are formed in the wells 10 and 20 at outer ends thereof, respectively, while no gate contacts are formed at the outer ends. Power supply lines VDD and VSS connected to the well contact regions are formed in the column direction in a second wiring layer above a first wiring layer.

Claims15

Dependent claims

A semiconductor integrated circuit comprising base cells arrayed in first and second directions perpendicular to each other, each base cell comprising:

an N-type well;
a plurality of P-type regions formed in said N-type well and arrayed in said second direction;
a P-type well arranged adjacent to said N-type well in said first direction;
a plurality of N-type regions formed in said P-type well and arrayed in said second direction;
gate lines each formed in said first direction with passing above a channel between adjacent two of said P-type regions and passing above a channel between adjacent two of said N-type regions, each of said gate lines not having gate contact regions at both ends thereof;
an N-type well contact region formed in said N-type well on a side of a first directional end of one of said gate lines;
a P-type well contact region formed in said P-type well on a side of an opposite first directional end of one of said gate lines;
an intra-cell interconnection formed in a first wiring layer;
a first power supply line connected to said N-type well contact region with passing in said second direction, said first power supply line formed in a second wiring layer above said first wiring layer;
and
a second power supply line connected to said P-type well contact region with passing in said second direction, said second power supply line formed in said second wiring layer.

8 more elements

A semiconductor integrated circuit comprising base cells arrayed in first and second directions perpendicular to each other, each base cell comprising:

an N-type well;
a plurality of P-type regions formed in said N-type well and arrayed in said second direction;
a P-type well arranged adjacent to said N-type well in said first direction;
a plurality of N-type regions formed in said P-type well and arrayed in said second direction;
gate lines each formed in said first direction with passing above a channel between adjacent two of said P-type regions and passing above a channel between adjacent two of said N-type regions, a first one of said gate lines not having gate contact regions at both ends thereof, a second one of said gate lines having gate contact regions at both ends thereof;
an N-type well contact region formed in said N-type well on a side of said first directional end of said first one of said gate lines;
a P-type well contact region formed in said P-type well on a side of the opposite first directional end of said first one of said gate lines;
Intra-cell interconnections formed in a first wiring layer;
a first power supply line connected to said N-type well contact region with passing in said second direction, said first power supply line formed in a second wiring layer above said first wiring layer;
and
a second power supply line connected to said P-type well contact region with passing in said second direction, said second power supply line formed in said second wiring layer.

8 more elements

A semiconductor integrated circuit comprising base cells arrayed in first and second directions perpendicular to each other, each base cell comprising:

an N-type well;
a plurality of P-type regions formed in said N-type well and arrayed in said second direction;
a P-type well arranged adjacent to said N-type well in said first direction;
a plurality of N-type regions formed in said P-type well and arrayed in said second direction;
gate lines each formed in said first direction with passing above a channel between adjacent two of said P-type regions and passing above a channel between adjacent two of said N-type regions, a first one of said gate lines having a gate contact region at a first directional end thereof and not having a gate contact region at the opposite first directional end thereof, a second one of said gate lines not having a gate contact region at a first directional end thereof and having a gate contact region at the opposite first directional end thereof;
an N-type well contact region formed in said N-type well on a side of said first directional end of said second one of said gate lines;
a P-type well contact region formed in said P-type well on a side of said opposite first directional end of said first one of said gate lines;
Intra-cell interconnections formed in a first wiring layer;
a first power supply line connected to said N-type well contact region with passing in said second direction, said first power supply line formed in a second wiring layer above said first wiring layer;
and
a second power supply line connected to said P-type well contact region with passing in said second direction, said second power supply line formed in said second wiring layer.

8 more elements

Dependencies are inferred from the claim text.