Sputtering method for filling holes with copper
AssigneeApplied Materials, Inc.
InventorsPeijun Ding, Tony Chiang, Barry L. Chin
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AssigneeApplied Materials, Inc.
InventorsPeijun Ding, Tony Chiang, Barry L. Chin
Estimating the term…
A method of filling trenches or vias on a semiconductor workpiece surface with copper using sputtering techniques. A copper wetting layer and a copper fill layer may both be applied by sputtering techniques. The thin wetting layer of copper is applied at a substrate surface temperature ranging between about 20° C. to about 250° C., and subsequently the temperature of the substrate is increased, with the application of the sputtered copper fill layer beginning at above at least about 200° C. and continuing while the substrate temperature is increased to a temperature as high as about 600° C. Preferably the substrate temperature during application of the sputtered fill layer ranges between about 300° C. and about 500° C.
A method of filling copper into a hole formed in a dielectric layer in a substrate, comprising the steps of:
A method of filling copper into a hole formed in a dielectric layer in a substrate, comprising the steps of:
A method of depositing copper into a hole formed in a substrate, comprising the steps of:
Dependencies are inferred from the claim text.