US 2003/0080407 A1 · Method of monitoring internal voltage and controlling a parameter of an integrated circuit

Abstract

An integrated circuit (I/C) assembly includes a dedicated voltage sensor line for determining with a high degree of accuracy the operating voltage at a predetermined sensor point on the IC die. The dedicated voltage sensor line connects the sensor point to an input/output (I/O) structure of the IC die, which in turn is connected to a voltage sense pin on the package of the IC assembly. In this manner, an end user can accurately monitor the operating voltage at the voltage sensor point on the IC. Additionally, an end user can connect a control circuit to the voltage sensor pin to control either the supply voltage or secondary parameters.

Claims5

Dependent claims

A method for monitoring an internal voltage on an integrated circuit (IC) die and controlling a parameter of the die, the method comprising:

providing a sensor point on the IC die;
connecting the sensor point to an output structure on the IC die via a dedicated trace on the IC;
coupling the output structure to a control circuit for controlling a parameter of the die;
and
controlling the parameter of the die.

2 more elements

Dependencies are inferred from the claim text.

Facts

Application

10/314,626Filed 9 Dec 2002

Priority

9 May 2000

Published

1 May 2003

Term ends

Not estimatedThe source records don’t support an estimate.

Classification4 codes

H10W 72/00
Interconnections or connectors in packages
H10W 72/50
Interconnections or connectors in packages: bond wires
H10W 72/932
Shapes of bond pads: plan-view shape, i.e. in top view
H10W
Generic packages, interconnections, connectors or other constructional details of devices covered by

Method of monitoring internal voltage and controlling a parameter of an integrated circuit

Life of this patent

Method of monitoring internal voltage and controlling a parameter of an integrated circuit

Life of this patent

Abstract

Claims5