Method of checking pattern measurement and image recognition assisting pattern
AssigneeRicoh Company, Ltd.
InventorKoichi Sogawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeRicoh Company, Ltd.
InventorKoichi Sogawa
Estimating the term…
A method of detecting a position of a size check pattern on a substrate by using a size check apparatus so as to measure a size of the size check pattern for a purpose of checking precision of production, comprising the steps of a) providing image recognition assisting patterns on the substrate on both sides of a portion to be measured of the size check pattern, b) setting the size check apparatus to have an image recognition area that includes both the size check pattern and the image recognition assisting patterns, and c) detecting the position of the size check pattern by use of the size check apparatus based on the size check pattern and the image recognition assisting patterns.
A method of detecting a position of a size check pattern on a substrate by using a size check apparatus so as to measure a size of the size check pattern for a purpose of checking precision of production, comprising the steps of:
An image recognition assisting pattern for assisting image recognition of a size check pattern formed on a substrate wherein a size of the size check pattern is to be measured for a purpose of checking precision of production, comprising patterns formed on both sides of a portion to be measured of the size check pattern.
Dependencies are inferred from the claim text.