Semiconductor device and method of manufacturing the same
AssigneeKioxia Corporation
InventorHidekazu Hayashi
Life of this patent
Estimating the term…
Loading patent…
AssigneeKioxia Corporation
InventorHidekazu Hayashi
Estimating the term…
In one embodiment, a method of manufacturing a semiconductor device includes forming a first film on a first substrate, forming a porous layer in a first portion of the first film and a non-porous layer in a second portion of the first film, forming a second film including a first device on the first film, forming a third film including a second device on a second substrate, and bonding the second film on the first substrate and the third film on the second substrate to be opposite to each other. Furthermore, the semiconductor device includes a first region and a second region. Moreover, the first device and the second device are located in the first region, the first portion is located among the first region and the second region, and the second portion is located in the second region.
A method of manufacturing a semiconductor device, comprising:
A semiconductor device comprising:
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.