H01J 49/429
Scanning an electric parameter
Official title: {Scanning an electric parameter, e.g. voltage amplitude or frequency}
H01J49/429 (Scanning an electric parameter) appears on 126 US grants and 101 published applications in this corpus.
Search patents in H01J- Granted patents
- 126
- Published applications
- 101
- Assignees
- 46
- Inventors
- 165
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 5 | 0 |
| 1995 | 6 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 0 | 0 |
| 2003 | 2 | 4 |
| 2004 | 3 | 3 |
| 2005 | 3 | 1 |
| 2006 | 1 | 2 |
| 2007 | 0 | 1 |
| 2008 | 3 | 3 |
| 2009 | 1 | 1 |
| 2010 | 2 | 4 |
| 2011 | 1 | 5 |
| 2012 | 2 | 1 |
| 2013 | 3 | 5 |
| 2014 | 6 | 7 |
| 2015 | 5 | 4 |
| 2016 | 5 | 4 |
| 2017 | 6 | 6 |
| 2018 | 3 | 3 |
| 2019 | 7 | 5 |
| 2020 | 12 | 9 |
| 2021 | 7 | 10 |
| 2022 | 4 | 5 |
| 2023 | 2 | 3 |
| 2024 | 6 | 7 |
| 2025 | 5 | 5 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus and method for ion separation11 Aug 2026US 12,706,292 B2Thermo Finnigan LLC
- Methods of calibrating a mass spectrometer16 Jun 2026US 12,658,416 B2Waters Technologies Ireland Limited
- Method for driving linear ion trap and mass spectrometer30 Dec 2025US 12,512,311 B2Shimadzu Corporation
- Method for authentication of animal species origin of leather products1 Jul 2025US 12,345,698 B2Chinese Academy of Inspection and Quarantine
- Mass spectrometry via frequency tagging1 Jul 2025US 12,347,668 B2Purdue Research Foundation
- Quadrupole mass filters and mass analysers23 Jul 2026US 2026/0213149 A1Micromass UK Limited
- Mass spectrometry via frequency tagging9 Apr 2026US 2026/0100344 A1Purdue Research Foundation
- Dynamically Concentrating Ion Packets in the Extraction Region of a TOF Mass Analyzer in Targeted Acquisition25 Sep 2025US 2025/0299942 A1DH Technologies Development Pte. Ltd.
- Method of mass spectrometry, a method of manipulating ions using an ion store, an ion store, a mass spectrometer and computer software3 Jul 2025US 2025/0218761 A1Thermo Fisher Scientific (Bremen) GmbH
- Mass spectrometer and control method thereof27 Mar 2025US 2025/0104994 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Method of mass analyzing a sample by use of a quadrupole ion trap179US 4,540,884 AFinnigan Corporation · 1985
- Mass spectrometer108US 6,906,319 B2Micromass UK Limited · 2005
- Method of operating ion trap detector in MS/MS mode107US 4,736,101 AFinnigan Corporation · 1988
- Mass scanning method using an ion trap mass spectrometer71US 5,714,755 AVarian Associates, Inc. · 1998
- Method of mass analyzing a sample by use of a quistor65US 4,882,484 AThe United States of America as represented by the Secretary of the Army · 1989