H01H 2001/0026
Wherein one or both contacts contain embedded contact wear signal material
Official title: {wherein one or both contacts contain embedded contact wear signal material, e.g. radioactive material being released as soon as the contact wear reaches the embedded layer}
H01H2001/0026 (Wherein one or both contacts contain embedded contact wear signal material) appears on 16 US grants and 13 published applications in this corpus.
Search patents in H01H- Granted patents
- 16
- Published applications
- 13
- Assignees
- 8
- Inventors
- 20
- Latest grant
- 11 Jul 2017
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 3 |
| 2005 | 1 | 3 |
| 2006 | 3 | 0 |
| 2007 | 0 | 2 |
| 2008 | 2 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 2 | 3 |
| 2017 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Mechanical wear, wipe and stroke measurement system for circuit breakers11 Jul 2017US 9,704,657 B2Eaton Corporation
- Mechanical wear, wipe and stroke measurement system for circuit breakers28 Jun 2016US 9,378,901 B2Eaton Corporation
- Contact wear detection by spectral analysis shift3 May 2016US 9,329,238 B1Schneider Electric USA, Inc.
- Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear part18 Sep 2012US 8,269,126 B2Kabushiki Kaisha Toshiba
- Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear part19 Oct 2010US 7,816,924 B2Kabushiki Kaisha Toshiba
- Mechanical Wear, Wipe and Stroke Measurement System for Circuit Breakers4 Aug 2016US 2016/0225543 A1Eaton Corporation
- Contact wear detection by spectral analysis shift19 May 2016US 2016/0139206 A1Schneider Electric USA, Inc.
- Mechanical wear, wipe and stroke measurement system for circuit breakers19 May 2016US 2016/0141117 A1Eaton Corporation
- Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear part30 Dec 2010US 2010/0326959 A1Kabushiki Kaisha Toshiba
- Gas insulated switchgear and method for detecting arc damage in a gas insulated switchgear part11 Sep 2008US 2008/0217297 A1Kabushiki Kaisha Toshiba
Most cited
By later US patents
- Electric contacts, electric contact apparatus and method for detecting abrasion of the electric contacts24US 7,049,532 B2Kabushiki Kaisha Toshiba · 2006
- Sensing structure for component wear in high voltage circuit interrupters15US 5,453,591 AABB Power T&D Company Inc. · 1995
- Mechanical wear, wipe and stroke measurement system for circuit breakers15US 9,378,901 B2Eaton Corporation · 2016
- Method and apparatus for detecting wear in components of high voltage electrical equipment13US 6,777,948 B2Electric Power Research Institute, Inc. · 2004
- Electrical contact wear and temperature indicator11US 6,023,036 A2000