G05B 2219/49181
Calculation, estimation, creation of error model using measured error values
G05B2219/49181 (Calculation, estimation, creation of error model using measured error values) appears on 18 US grants and 21 published applications in this corpus.
Search patents in G05B- Granted patents
- 18
- Published applications
- 21
- Assignees
- 20
- Inventors
- 47
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 2 |
| 2004 | 0 | 2 |
| 2005 | 3 | 1 |
| 2006 | 1 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 0 | 2 |
| 2012 | 2 | 1 |
| 2013 | 1 | 0 |
| 2014 | 0 | 3 |
| 2015 | 1 | 0 |
| 2016 | 1 | 0 |
| 2017 | 2 | 0 |
| 2018 | 0 | 2 |
| 2019 | 0 | 2 |
| 2020 | 2 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
| 2024 | 0 | 1 |
| 2025 | 0 | 0 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and systems for determining compensation parameters25 Aug 2026US 12,717,302 B2Siemens Aktiengesellschaft
- In-situ grinding wheel topography, power monitoring, and feed/speed scheduling systems and methods31 Mar 2026US 12,589,459 B2Rtx Corporation
- Machine learning device and machining time prediction device2 Feb 2021US 10,908,591 B2Fanuc Corporation
- Method for compensating milling cutter deflection29 Sep 2020US 10,788,807 B2Dr. Johannes Heidenhain GmbH
- Failure models for embedded analytics and diagnostic/prognostic reasoning28 Apr 2020US 10,635,094 B2Siemens Aktiengesellschaft
- Method and systems for determining compensation parameters30 May 2024US 2024/0176323 A1Siemens Aktiengesellschaft
- In-situ grinding wheel topography, power monitoring, and feed/speed scheduling systems and methods3 Aug 2023US 2023/0241741 A1Raytheon Technologies Corporation
- Computer-readable recording medium recording estimation program, estimation method, and information processing device6 Feb 2020US 2020/0042876 A1Fujitsu Limited
- Apparatus, method, and computer readable media for controlling machining parameters27 Jun 2019US 2019/0196441 A1Cloud Network Technology Singapore Pte. Ltd.
- Failure models for embedded analytics and diagnostic/prognostic reasoning27 Jun 2019US 2019/0196460 A1Siemens Aktiengesellschaft
Most cited
By later US patents
- Method and apparatus for wafer disposition based on systematic error modeling42US 5,960,185 AInternational Business Machines Corporation · 1999
- Method and apparatus for determining calibration options in a motion control system37US 6,850,806 B2Siemens Energy & Automation, Inc. · 2005
- Method and apparatus for tuning compensation parameters in a motion control system associated with a mechanical member28US 6,865,499 B2Siemens Energy & Automation, Inc. · 2005
- Method and apparatus for tuning compensation parameters in a motion control system associated with a mechanical member24US 6,920,408 B2Siemens Energy & Automation, Inc. · 2005
- System and process for measuring, compensating and testing numerically controlled machine tool heads and/or tables11US 7,245,982 B2Fidia S.p.A. · 2007