G05B 2219/23434
Select automatically prefered program data, ordered to most used program
G05B2219/23434 (Select automatically prefered program data, ordered to most used program) appears on 6 US grants and 8 published applications in this corpus.
Search patents in G05B- Granted patents
- 6
- Published applications
- 8
- Assignees
- 5
- Inventors
- 12
- Latest grant
- 5 Dec 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 0 |
| 2017 | 0 | 3 |
| 2018 | 0 | 0 |
| 2019 | 2 | 0 |
| 2020 | 1 | 0 |
| 2021 | 0 | 1 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
By publication year.
Recent patents
- Source code and module recommendation system, and module assembly5 Dec 2023US 11,836,639 B2Luxrobo Co., Ltd.
- Event analysis device, event analysis system, event analysis method, and event analysis program26 May 2020US 10,664,374 B2Yokogawa Electric Corporation
- Event analysis apparatus, an event analysis system, an event analysis method, and an event analysis program24 Dec 2019US 10,515,083 B2Yokogawa Electric Corporation
- Event analysis apparatus, event analysis systems, event analysis methods, and event analysis program3 Dec 2019US 10,496,655 B2Yokogawa Electric Corporation
- Method and system for monitoring an industrial process2 Feb 2016US 9,250,772 B2ABB Research Ltd.
- Source code and module recommendation system, and module assembly13 May 2021US 2021/0142185 A1Luxrobo Co., Ltd.
- Event analysis device, event analysis system, event analysis method, and event analysis program11 May 2017US 2017/0132104 A1Yokogawa Electric Corporation
- Event analysis apparatus, an event analysis system, an event analysis method, and an event analysis program11 May 2017US 2017/0132291 A1Yokogawa Electric Corporation
- Event analysis apparatus, event analysis systems, event analysis methods, and event analysis program11 May 2017US 2017/0132292 A1Yokogawa Electric Corporation
- Method and system for monitoring an industrial process29 Aug 2013US 2013/0227459 A1ABB Research Ltd.
Most cited
By later US patents