G03B 43/02
Testing shutters
G03B43/02 (Testing shutters) appears on 18 US grants and 7 published applications in this corpus.
Search patents in G03B- Granted patents
- 18
- Published applications
- 7
- Assignees
- 12
- Inventors
- 30
- Latest grant
- 17 Apr 2018
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 2 | 2 |
| 2018 | 2 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Method and apparatus for calibrating multiple cameras using mirrors17 Apr 2018US 9,948,926 B2Electronics and Telecommunications Research Institute
- Method of measuring display delay time, display device, and method of manufacturing display13 Mar 2018US 9,918,078 B2Seiko Epson Corporation
- Method of measuring display delay of camera and display delay measurement apparatus19 Sep 2017US 9,769,470 B2Seiko Epson Corporation
- Method of measuring shutter time lag, display device for measuring shutter time lag, shutter time lag measurement apparatus, method of manufacturing camera, method of measuring display delay of camera, and display delay measurement apparatus7 Feb 2017US 9,565,425 B2Seiko Epson Corporation
- Determination of mechanical shutter exposure time25 May 2010US 7,724,301 B2Nokia Corporation
- Rotary adjuster with improved optical rotary position detection24 May 2018US 2018/0143521 A1Preh GmbH
- Method of measuring display delay time, display device, and method of manufacturing display30 Nov 2017US 2017/0347090 A1Seiko Epson Corporation
- Method of measuring display delay of camera and display delay measurement apparatus27 Apr 2017US 2017/0118465 A1Seiko Epson Corporation
- Method and apparatus for calibrating multiple cameras using mirrors10 Nov 2016US 2016/0330437 A1Electronics and Telecommunications Research Institute
- Method of measuring shutter time lag, display device for measuring shutter time lag, shutter time lag measurement apparatus, method of manufacturing camera, method of measuring display delay of camera, and display delay measurement apparatus20 Aug 2015US 2015/0237343 A1Seiko Epson Corporation
Most cited
By later US patents
- Determination of mechanical shutter exposure time55US 7,724,301 B2Nokia Corporation · 2010
- Camera having a shutter measuring apparatus7US 5,758,213 ANikon Corporation · 1998
- Photographic combination for use in radiography6US 6,394,650 B1Konica Corporation · 2002
- Method of measuring shutter time lag, display device for measuring shutter time lag, shutter time lag measurement apparatus, method of manufacturing camera, method of measuring display delay of camera, and display delay measurement apparatus5US 9,565,425 B2Seiko Epson Corporation · 2017
- Autoranging method and system for testing the speeds of a camera shutter4US 4,031,739 A1977