G01N 2201/0655
Hemispheres
G01N2201/0655 (Hemispheres) appears on 18 US grants and 21 published applications in this corpus.
Search patents in G01N- Granted patents
- 18
- Published applications
- 21
- Assignees
- 17
- Inventors
- 38
- Latest grant
- 7 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 4 |
| 2012 | 2 | 0 |
| 2013 | 3 | 1 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 2 | 3 |
| 2019 | 2 | 2 |
| 2020 | 1 | 1 |
| 2021 | 0 | 1 |
| 2022 | 1 | 1 |
| 2023 | 2 | 2 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Moisture sensor and image forming apparatus7 Oct 2025US 12,436,100 B2Canon Kabushiki Kaisha
- Gas sensor with long absorption path length5 Sep 2023US 11,747,274 B2Senseair AB
- Light measurement device and light measurement method18 Jul 2023US 11,703,389 B2Hamamatsu Photonics K.K.
- Quality measurement method and quality measurement device for long sheet material25 Jan 2022US 11,231,363 B2P.S.M. International PLC
- Optics cup with curved bottom4 Aug 2020US 10,731,123 B2Pocared Diagnostics Ltd.
- Moisture sensor and image forming apparatus8 Jan 2026US 2026/0009726 A1Canon Kabushiki Kaisha
- Diffuse multi-reflection optical device with light re-direction for spectrometer collection7 Mar 2024US 2024/0077419 A1Si-Ware Systems
- Moisture sensor and image forming apparatus23 Nov 2023US 2023/0375471 A1Canon Kabushiki Kaisha
- Gas sensor with long absorption path length20 Apr 2023US 2023/0117008 A1Senseair AB
- Compact in-line non-contact optical property measurement system3 Mar 2022US 2022/0065779 A1NDC Technologies, Inc.
Most cited
By later US patents
- Spectrophotometric method and apparatus for the non-invasive672US 4,655,225 AKurabo Industries Ltd. · 1987
- Semiconductor wafer surface inspection apparatus and method72US 4,740,708 AInternational Business Machines Corporation · 1988
- System and method for acquiring images31US 8,284,305 B2Parata Systems, LLC · 2012
- Portable spectrophotometer21US 4,968,143 AMaxmeyer-Duco MM.D. S.p.A. · 1990
- Light scattering measurement system based on flexible sensor array14US 8,405,832 B2Palo Alto Research Center Incorporated · 2013