G01J 2001/083
Testing response of detector
Official title: {Testing response of detector}
G01J2001/083 (Testing response of detector) appears on 36 US grants and 37 published applications in this corpus.
Search patents in G01J- Granted patents
- 36
- Published applications
- 37
- Assignees
- 34
- Inventors
- 88
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 2 |
| 2015 | 0 | 3 |
| 2016 | 3 | 4 |
| 2017 | 4 | 2 |
| 2018 | 3 | 3 |
| 2019 | 3 | 4 |
| 2020 | 5 | 3 |
| 2021 | 1 | 3 |
| 2022 | 3 | 2 |
| 2023 | 4 | 2 |
| 2024 | 1 | 4 |
| 2025 | 1 | 1 |
| 2026 | 3 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing an arc detecting system26 May 2026US 12,638,329 B2ABB Schweiz AG
- Device for measuring the performance of an optical detector, and associated measuring method28 Apr 2026US 12,613,160 B2Lynred
- Measurement method for characterization of a photodetector17 Mar 2026US 12,578,224 B2ams-OSRAM Internatioanl GmbH
- Light sensing method having sensing order adjusting mechanism18 Mar 2025US 12,253,409 B2Anpec Electronics Corporation
- Low power gunshot sensor evaluation31 Dec 2024US 12,181,242 B1Shooter Detection Systems, LLC
- Method and calibration device for calibrating a detector device under test11 Jun 2026US 2026/0160594 A1Airbus Defence and Space GmbH
- Light source arrangement for improved sensitivity measurements of ambient light and color sensors and method for providing such a light source arrangement23 Apr 2026US 2026/0110575 A1ams-OSRAM Asia Pacific Pte. Ltd.
- Beam profiler certification and calibration23 Oct 2025US 2025/0327740 A1The Boeing Company
- Device for measuring the performance of an optical detector, and associated measuring method21 Nov 2024US 2024/0385073 A1Lynred
- Testing an arc detecting system26 Sep 2024US 2024/0319004 A1ABB Schweiz AG
Most cited
By later US patents
- Wafer level testing of optical devices42US 8,724,100 B1Kotura, Inc. · 2014
- Multiple discrete analyzer test apparatus and method8US 5,369,484 AAkzo N. V. · 1994
- System for producing uniform illumination for testing two dimensional detector arrays and optical systems6US 6,191,891 B12001
- Method and system for performing testing of photonic devices5US 9,236,958 B2Skorpios Technologies, Inc. · 2016
- On-car stray-light testing cart4US 10,791,324 B1Waymo LLC · 2020