G01F 23/243

Schematic arrangements of probes combined with measuring circuits

Official title: {Schematic arrangements of probes combined with measuring circuits}

G01F23/243 (Schematic arrangements of probes combined with measuring circuits) appears on 209 US grants and 146 published applications in this corpus.

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Granted patents
209
Published applications
146
Assignees
159
Inventors
453
Latest grant
6 Oct 2026

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G01F 23/243: granted patents and published applications per publication year
YearGranted patentsPublished applications
197660
197740
197840
197920
198010
198120
198240
198350
198400
198510
198610
198710
198830
198900
199020
199170
199250
199360
199450
199540
199690
199720
199870
199960
200050
200132
200236
2003108
200464
2005614
2006115
2007411
200831
200975
201035
201127
201226
201343
201446
201566
201654
201735
201854
201944
202077
202125
202234
202325
2024412
202565
202622

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