G01B 11/167
By projecting a pattern on the object
Official title: {by projecting a pattern on the object}
G01B11/167 (By projecting a pattern on the object) appears on 71 US grants and 72 published applications in this corpus.
Search patents in G01B- Granted patents
- 71
- Published applications
- 72
- Assignees
- 74
- Inventors
- 186
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 2 |
| 2005 | 1 | 1 |
| 2006 | 0 | 0 |
| 2007 | 0 | 2 |
| 2008 | 1 | 0 |
| 2009 | 1 | 1 |
| 2010 | 1 | 2 |
| 2011 | 0 | 2 |
| 2012 | 1 | 0 |
| 2013 | 0 | 2 |
| 2014 | 1 | 3 |
| 2015 | 2 | 5 |
| 2016 | 3 | 6 |
| 2017 | 4 | 3 |
| 2018 | 6 | 4 |
| 2019 | 4 | 7 |
| 2020 | 6 | 9 |
| 2021 | 7 | 2 |
| 2022 | 4 | 4 |
| 2023 | 2 | 4 |
| 2024 | 7 | 6 |
| 2025 | 5 | 6 |
| 2026 | 5 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- High resolution optical displacement measurement1 Sep 2026US 12,723,872 B2Palladyne Corp.
- Detector device, for measuring the calibre of ceramic tiles or slabs21 Apr 2026US 12,607,460 B2System Ceramics S.P.A.
- High resolution optical displacement measurement7 Apr 2026US 12,596,000 B2Sarcos Corp.
- High resolution optical displacement measurement17 Mar 2026US 12,578,186 B2Sarcos Corp.
- Systems for disc blade deformation detection20 Jan 2026US 12,527,240 B2CNH Industrial Canada, Ltd.
- Inspection apparatus and methods of using the same5 Feb 2026US 2026/0036525 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Wafer stage lifting system and method for raising a wafer stage9 Oct 2025US 2025/0314976 A1Lids Semiconductor Technology Co., Ltd.
- High Resolution Optical Displacement Measurement28 Aug 2025US 2025/0271257 A1Sarcos Corp.
- High Resolution Optical Displacement Measurement28 Aug 2025US 2025/0271258 A1Sarcos Corp.
- High Resolution Optical Displacement Measurement21 Aug 2025US 2025/0264327 A1Sarcos Corp.
Most cited
By later US patents
- Optical grid enhancement for improved motor location487US 8,976,368 B2Intermec IP Corp. · 2015
- Method and system for input detection using structured light projection210US 8,955,973 B2Google Inc. · 2015
- Optical method and apparatus for determining three-dimensional changes in facial contours72US 4,825,263 ARutgers University · 1989
- Non-contact deformation measurement22US 6,078,396 ABritish Aerospace Public Limited Company · 2000
- Method and apparatus for measuring thermal warpage21US 5,601,364 AGeorgia Tech Research Corporation · 1997