G01B 11/024
By means of diode-array scanning
Official title: {by means of diode-array scanning}
G01B11/024 (By means of diode-array scanning) appears on 308 US grants and 123 published applications in this corpus.
Search patents in G01B- Granted patents
- 308
- Published applications
- 123
- Assignees
- 209
- Inventors
- 572
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 4 | 0 |
| 1980 | 5 | 0 |
| 1981 | 6 | 0 |
| 1982 | 3 | 0 |
| 1983 | 10 | 0 |
| 1984 | 10 | 0 |
| 1985 | 10 | 0 |
| 1986 | 15 | 0 |
| 1987 | 21 | 0 |
| 1988 | 13 | 0 |
| 1989 | 9 | 0 |
| 1990 | 5 | 0 |
| 1991 | 7 | 0 |
| 1992 | 8 | 0 |
| 1993 | 10 | 0 |
| 1994 | 14 | 0 |
| 1995 | 8 | 0 |
| 1996 | 2 | 0 |
| 1997 | 6 | 0 |
| 1998 | 7 | 0 |
| 1999 | 6 | 0 |
| 2000 | 4 | 0 |
| 2001 | 3 | 2 |
| 2002 | 7 | 10 |
| 2003 | 9 | 4 |
| 2004 | 9 | 9 |
| 2005 | 9 | 7 |
| 2006 | 5 | 8 |
| 2007 | 4 | 7 |
| 2008 | 6 | 3 |
| 2009 | 5 | 13 |
| 2010 | 5 | 13 |
| 2011 | 3 | 2 |
| 2012 | 13 | 4 |
| 2013 | 2 | 2 |
| 2014 | 2 | 3 |
| 2015 | 3 | 2 |
| 2016 | 3 | 3 |
| 2017 | 9 | 3 |
| 2018 | 3 | 3 |
| 2019 | 3 | 3 |
| 2020 | 2 | 4 |
| 2021 | 3 | 5 |
| 2022 | 3 | 1 |
| 2023 | 2 | 9 |
| 2024 | 2 | 1 |
| 2025 | 5 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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Most cited
By later US patents
- Computer aided inspection machine368US 6,064,759 A2000
- Critical dimension analysis with simultaneous multiple angle of incidence measurements357US 6,429,943 B1Therma-Wave, Inc. · 2002
- Optoelectronic distance sensor with visible pilot beam270US 4,825,091 ACarl-Zeiss-Stiftung · 1989
- Pattern recognition system168US 4,441,205 AKulicke and Soffa Industries, Inc. · 1984
- Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like168US 4,818,110 AKLA Instruments Corporation · 1989