Systems & Processes Engineering Corporation
Austin, TX, US· latest recorded location
Systems & Processes Engineering Corporation is named on 7 US grants and 2 published applications in this corpus. Its most frequent classification is G01K (Measuring temperature).
- Granted patents
- 7
- Published applications
- 2
- Inventors
- 7
- Granted in 2026 so far
- 0
- Most recent grant
- 3 Apr 2007
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 2 | 1 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 1 | 0 |
By publication year.
Technology areas
Share of 9 documents
- G01KMeasuring temperature5
- G01MTesting static or dynamic balance of machines or structures4
- G01NInvestigating or analysing materials by determining their chemical or physical properties2
- G01BMeasuring length, thickness or similar linear dimensions1
- G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of1
- G01SRadio direction-finding1
Recent patents
- Signal generation and mixing electronics for frequency-domain lifetime and spectral fluorometry3 Apr 2007US RE39,537 E1
- Method and system for measuring optical scattering characteristics6 Jun 2006US 7,057,714 B2
- Method and system for measuring optical scattering characteristics12 Aug 2003US 6,606,148 B2
- Method and system for sensing optical fiber temperature25 Feb 2003US 6,524,001 B1
- Signal generation and mixing electronics for frequency-domain lifetime and spectral fluorometry9 Nov 1999US 5,981,957 A
Most cited
By later US patents
- Chemometric analysis for extraction of individual fluorescence spectrum and lifetimes from a target mixture142US 5,955,737 A1999
- Precision optical displacement measurement system21US 5,737,085 A1998
- Signal generation and mixing electronics for frequency-domain lifetime and spectral fluorometry14US 5,981,957 A1999
- Method and system for measuring optical scattering characteristics9US 6,606,148 B22003
- Method and system for measuring optical scattering characteristics8US 7,057,714 B22006