Meterologic Instruments, Inc.
Blackwood, NJ, US· latest recorded location
Meterologic Instruments, Inc. is named on 2 US grants and 1 published applications in this corpus. Its most frequent classification is G06K (Graphical data reading).
- Granted patents
- 2
- Published applications
- 1
- Inventors
- 11
- Granted in 2026 so far
- 0
- Most recent grant
- 16 Jun 2009
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
By publication year.
Technology areas
Share of 3 documents
- G06KGraphical data reading3
- G02BOptical elements, systems or apparatus1
- G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial1
- G06VImage and video recognition1
- H01SDevices using the process of light amplification by stimulated emission of radiation1
Recent patents
- Digital image capture and processing system employing real-time analysis of image exposure quality and the reconfiguration of system control parameters based on the results of such exposure quality analysis16 Jun 2009US 7,546,951 B2
- X-radiation scanning system having an automatic object identification and attribute information acquisition and linking mechanism integrated therein4 Dec 2007US 7,303,132 B2
Most cited
By later US patents
- Digital image capture and processing system employing real-time analysis of image exposure quality and the reconfiguration of system control parameters based on the results of such exposure quality analysis13US 7,546,951 B22009
- X-radiation scanning system having an automatic object identification and attribute information acquisition and linking mechanism integrated therein11US 7,303,132 B22007