Exail
SAINT-GERMAN-EN-LAYE, FR· latest recorded location
EXAIL is named on 24 US grants and 15 published applications in this corpus. Its most frequent classification is G01C (Measuring distances, levels or bearings).
- Granted patents
- 24
- Published applications
- 15
- Inventors
- 48
- Granted in 2026 so far
- 9
- Most recent grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2023 | 3 | 0 |
| 2024 | 5 | 9 |
| 2025 | 7 | 3 |
| 2026 | 9 | 3 |
By publication year. 2026 runs to 8 Oct.
Technology areas
Share of 39 documents
- G01CMeasuring distances, levels or bearings16
- B63BShips or other waterborne vessels8
- B63GOffensive or defensive arrangements on vessels6
- B63CLaunching, hauling-out, or dry-docking of vessels5
- G02FOptical devices or arrangements for the control of light by modification of4
- B61LGuiding railway traffic3
- G01PMeasuring linear or angular speed, acceleration, deceleration, or shock3
- B63HMarine propulsion or steering2
- F16LPipes2
- F41GWeapon sights2
Recent patents
- System for recovering autonomous underwater or surface water vehicles14 Jul 2026US 12,679,517 B2
- Device for measuring angular errors in the inclination of the true axis of rotation of a rotary element, and associated method16 Jun 2026US 12,656,118 B2
- Generator for generating an anti-Kerr-effect modulated light signal, interferometry measuring device comprising such a generator, and method for modulating a light signal9 Jun 2026US 12,650,306 B2
- Method for estimating angular errors of angle coders in precision rotary devices, device26 May 2026US 12,638,311 B2
- Method for reducing the Kerr effect in an interferometry measuring device, and interferometry measuring device configured to implement this method19 May 2026US 12,631,451 B2
- Method for manufacturing an integrated electro-optical device, and electro-optical device thus obtained17 Sep 2026US 2026/0277036 A1
- Cold-atom and light-pulse interferometric system and method, for the on-board measurement of acceleration or rotation20 Aug 2026US 2026/0243571 A1
- Method for bonding a mems to a substrate25 Jun 2026US 2026/0176131 A1
- Optical fibre interferometer and method for measuring a magnetic field or an electrical current based on said interferometer15 May 2025US 2025/0155476 A1
- Device for measuring angular errors in the inclination of the true axis of rotation of a rotary element, and associated method1 May 2025US 2025/0137784 A1
Most cited
By later US patents