Advanced Surface Microscopy, Inc.
Indianapolis, IN, US· latest recorded location
Advanced Surface Microscopy, Inc. is named on 2 US grants and 0 published applications in this corpus. Its most frequent classification is G01Q (Scanning-probe techniques or apparatus).
- Granted patents
- 2
- Published applications
- 0
- Inventors
- 2
- Granted in 2026 so far
- 0
- Most recent grant
- 20 Oct 1998
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
By publication year.
Technology areas
Share of 2 documents
Recent patents
- High precison calibration and feature measurement system for a scanning probe microscope20 Oct 1998US 5,825,670 A
- High precision calibration and feature measurement system for a scanning probe microscope1 Jul 1997US 5,644,512 A
No published applications.
Most cited
By later US patents