4D Sensor Inc.
Wakayama, JP· latest recorded location
4D SENSOR INC. is named on 3 US grants and 3 published applications in this corpus. Its most frequent classification is G01B (Measuring length, thickness or similar linear dimensions).
- Granted patents
- 3
- Published applications
- 3
- Inventors
- 5
- Granted in 2026 so far
- 0
- Most recent grant
- 4 Feb 2020
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2017 | 0 | 1 |
| 2018 | 1 | 2 |
| 2019 | 1 | 0 |
| 2020 | 1 | 0 |
By publication year.
Technology areas
Share of 6 documents
Recent patents
- Apparatus and method for measuring 3D form or deformation of an object surface using a grid pattern and reference plane4 Feb 2020US 10,551,177 B2
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded23 Apr 2019US 10,267,626 B2
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded13 Feb 2018US 9,891,042 B2
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded10 May 2018US 2018/0128602 A1
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded5 Apr 2018US 2018/0094918 A1
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded13 Apr 2017US 2017/0102228 A1
Most cited
By later US patents
- Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded3US 10,267,626 B22019
- Apparatus and method for measuring 3D form or deformation of an object surface using a grid pattern and reference plane3US 10,551,177 B22020