Continuous high resolution surface profiling apparatus and method

A method of profiling a surface using a surface profiling apparatus mounted on a plurality of wheels, at least two of said wheels being aligned to contact the surface in a longitudinally collinear manner, the method comprising:

• acquiring data relating to:
• a longitudinal distance ΔD travelled by said profiler surface profiling apparatus from a longitudinal distance measuring apparatus mounted on said profiler surface profiling apparatus;
• an angle α of said profiler surface profiling apparatus relative to a horizontal plane intersecting said surface at a location of one of said wheels where a point of the wheel, a vertical line and a line collinear with a diameter of the wheel intersect, from a longitudinal inclination measuring apparatus comprising a first inclinometer mounted on said profiler surface profiling apparatus;
• and
• a vertical distance Lf between said profiler surface profiling apparatus and said surface from a first vertical distance measuring apparatus mounted on said profiler surface profiling apparatus;
• a vertical distance Lr between said frame and said surface from a second vertical distance measuring apparatus mounted on said profiler surface profiling apparatus;
• said first and second vertical distance measuring apparatuses being mounted collinearly with said wheels and separated by a distance L;
• calculating an incremental change in surface elevation ΔE, using the formula:
• Δ
• ⁢
• E
• =
• ΔDsin
• ⁡
• (
• α
• +
• tan
• -
• 1
• (
• (
• L
• f
• -
• L
• r
• )
• L
• )
• )
• ;
• and
• adding said incremental change to an accumulated elevation series which represents a profile of said surface.

A method of profiling a surface using a surface profiling apparatus mounted on a plurality of wheels, at least two of said wheels being aligned to contact the surface in a longitudinally collinear manner, the method comprising:

• moving the profiler surface profiling apparatus a longitudinal distance increment ΔD;
• obtaining a vertical distance Lf between said surface profiling apparatus and said surface from a first vertical distance measuring device, and a vertical distance Lr between said surface profiling apparatus and said surface from a second vertical distance measuring device, said first and second vertical distance measuring apparatuses being mounted on said surface profiling apparatus collinearly with said at least two wheels and separated by a distance L;
• calculating a first angle β between said vertical distances Lf, Lr and said distance L using the formula:
• β
• =
• tan
• -
• 1
• (
• (
• L
• f
• -
• L
• r
• )
• L
• )
• ;
• obtaining an angle α of said profiler surface profiling apparatus relative to a horizontal plane intersecting said surface at a location of one of said wheels where a point of the wheel, a vertical line and a line collinear with a diameter of the wheel intersect, from a longitudinal inclination measuring apparatus comprising a first inclinometer mounted on said profiler surface profiling apparatus;
• calculating an incremental change in surface elevation ΔE, using the formula:
• ΔE =ΔD sin(α+β);
• and adding said incremental change to an accumulated elevation series which represents a profile of said surface.