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US D894,024 S1Granted
Housing for a test and measurement instrument
AssigneeTektronix, Inc.
InventorsBrian A. Hollenberg, Jessica Anna Dunn, Stephen LaFrance, Taylor S. K. Heen, Jonathan D. Clem, Joshua J. O'Brien, Preston S. Gabel, Marc A. Gessford
Life of this patent
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Abstract
The abstract isn’t available for this document.
Claims1
The ornamental design for a housing for a test and measurement instrument, as shown and described.