US D655,824 S1Granted

Specimen analyzer

AssigneeSysmex Corporation

InventorsKeisuke Tsutsumida, Fumie Shibata, Shinya Nakajima

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Abstract

The abstract isn’t available for this document.

Claims1

Dependent claims

We claim the ornamental design for a specimen analyzer, as shown and described.

Facts

Application: 29/387,842Filed 18 Mar 2011
Priority: JP 2010-02279422 Sep 2010
Granted: 13 Mar 2012
Term ends: Not estimatedThe source records don’t support an estimate.

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