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US D482,796 S1Granted
Sample analyzer
AssigneeSysmex Corporation
InventorsYasuhiro Oyama, Kazuyuki Sakurai, Yoichi Nakamura, Noriyoshi Yoshida, Kazutoshi Tokunaga, Masami Ishizaki
Life of this patent
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Abstract
The abstract isn’t available for this document.
Claims1
The ornamental design for a sample analyzer, as shown and described.