US D1,108,988 S1Granted

Apparatus for measuring light scattering of a sample

AssigneeWyatt Technology Corporation

InventorsSigrid C. Kuebler, Ross E. Bryant, Shiladitya Sen, Ryan Olson, Nicholas Wong, Marco Vanella, Ryan Thomas, Patrick Tufts, Jared Naito

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The abstract isn’t available for this document.

Dependent claims

The ornamental design for an apparatus for measuring light scattering of a sample, as shown and described.

G01N 21/47
Systems in which incident light is modified in accordance with the properties of the material investigated: scattering, i.e. diffuse reflection
G01N 2201/0227
Casings: sealable enclosure
G01N
Investigating or analysing materials by determining their chemical or physical properties

From the US filing history. Foreign family members aren’t listed.

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