Protection circuit of semiconductor device
AssigneeDenso Corporation
InventorKazuhiro Oyama
Life of this patent
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Abstract
A protection circuit of a semiconductor device includes a high electron mobility transistor and a protection element. Between the drain and the gate of the high electron mobility transistor, the protection element includes: a thyristor; and a first resistor connected in series to the thyristor. Between the source and the gate of the high electron mobility transistor, the protection element includes: a second resistor and an interrupter that is connected in series to the second resistor. The interrupter interrupts a flow of a current between the drain and the gate when the thyristor is turned off, and the interrupter permits the current to flow between the drain and the gate when the thyristor is turned on.
Claims9
A protection circuit of a semiconductor device, comprising:
- a high electron mobility transistor as a semiconductor switching element that is connected to a load and turns on or off an electric power supply to the load;
- and
- a protecting element that includes:
- a thyristor connected in a forward direction and a first resistor connected in series to the thyristor between a drain and a gate of the high electron mobility transistor;
- and
- a second resistor and an interrupter connected in series to the second resistor between a source and the gate of the high electron mobility transistor,
- wherein the interrupter interrupts a flow of a current between the drain and the gate of the high electron mobility transistor when the thyristor is turned off, and
- wherein the interrupter permits the flow of the current between the drain and the gate of the high electron mobility transistor when the thyristor is turned on;
- wherein a drain voltage of the high electron mobility transistor when turning off the high electron mobility transistor is clamped at a clamp voltage equal to a forward breakdown voltage of the thyristor.
Dependencies are inferred from the claim text.