Test support device and test support method
AssigneeNEC Corporation
InventorTakayuki Kuroda
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AssigneeNEC Corporation
InventorTakayuki Kuroda
Estimating the term…
A test support device which can test all configurations of a system including a specific system component, comprehensively and quickly, is provided. A test support device (100) includes a storage unit (102) and an extraction processing unit (101). A configuration of a system is defined with a plurality of functionalities to be maintained by the system and a set of programs implementing the functionalities respectively. The storage unit (102) stores component-relation information (201) which indicates an identifier of each of one or more systems, an identifier of each of a plurality of functionalities to be maintained by each of the systems, and an identifier of each of one or more programs being capable of implementing each of the functionalities. The extraction processing unit (101) extracts, when a functionality or a program is specified, a configuration of a system including the specified functionality or the specified program on the basis of the component-relation information (201), and outputs the extracted configuration of a system.
A test support device comprising:
A test support method comprising:
A non-transitory computer readable storage medium recording thereon a computer program causing a computer to perform a method comprising:
A test support device comprising:
Dependencies are inferred from the claim text.
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Prevention of errors by analysis, debugging or testing of software: environments for analysis, debugging or testing of software
Software maintenance or management: version control ; Configuration management
Software maintenance or management: structural analysis for program understanding
Test management: for test version control, e.g. updating test cases to a new software version
About 7 years 4 months of term left · ends 6 Mar 2034 (estimated)
This application is a National Stage Entry of PCT/JP2013/007192 filed on Dec. 6, 2013, which claims priority from Japanese Patent Application 2012-270364 filed on Dec. 11, 2012, the contents of all of which are incorporated herein by reference, in their entirety.
The present invention relates to a test support device and a test support method.
In general, constructing a software system means arranging an environment in which plural and different pieces of middleware, which are installed or set, work cooperatively.
FIG. 1 is a block diagram showing a characteristic configuration of a first exemplary embodiment of the present invention.
FIG. 2 is a block diagram showing a configuration of a test support device 100 in the first exemplary embodiment of the present invention.
FIG. 3 is a flowchart showing processes carried out by the test support device 100 in the first exemplary embodiment of the present invention.
A first exemplary embodiment of the present invention will be explained.
Firstly, a configuration according to the first exemplary embodiment of the present invention will be explained. FIG. 2 is a block diagram showing a configuration of a test support device 100 in the first exemplary embodiment of the present invention.
With reference to FIG. 2, the test support device 100 of the first exemplary embodiment of the present invention includes an extraction processing unit (or extraction unit) 101 and a storage unit 102. The test support device 100 is communicatably connected with an input and output device 110 used by a user for inputting and outputting information, through a network or the like.