Endoscope system

An endoscope system comprising a head-separated camera apparatus including a head portion including an image pickup device and a connector portion integrally connected to the head portion via a cable, and a signal processing apparatus attachable to and detachable from the head-separated camera apparatus via the connector portion, wherein

• the head portion comprises:
• a first test pattern generating portion configured to generate a first test pattern signal;
• and
• a first transmitting portion configured to transmit the first test pattern signal generated by the first test pattern generating portion via the cable;
• the connector portion comprises:
• a first receiving portion configured to receive the first test pattern signal transmitted from the first transmitting portion;
• a first detection circuit configured to detect a predetermined data pattern from the first test pattern signal received by the first receiving portion and output a first generation starting signal;
• a second test pattern generating portion configured to generate a second test pattern signal, which is a same pattern signal as the first test pattern, based on the first generation starting signal;
• a first comparison circuit configured to output a comparison result of comparing the first test pattern signal with the second test pattern signal;
• a third test pattern generating portion configured to generate a third test pattern signal;
• and
• a second transmitting portion configured to transmit the third test pattern signal generated by the third test pattern generating portion;
• and
• the signal processing apparatus comprises:
• a second receiving portion configured to receive the third test pattern signal transmitted from the second transmitting portion;
• a second detection circuit configured to detect a predetermined data pattern from the third test pattern signal received by the second receiving portion and output a second generation starting signal;
• a fourth test pattern generating portion configured to generate a fourth test pattern signal, which is a same pattern signal as the third test pattern, based on the second generation starting signal;
• and
• a second comparison circuit configured to output a comparison result of comparing the third test pattern signal with the fourth test pattern signal.