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US 9,753,154 B2Granted
X-ray detector
AssigneeSiemens Aktiengesellschaft
InventorsPeter Hackenschmied, Christian Schröter, Matthias Strassburg
Life of this patent
Estimating the term…
Abstract
An X-ray detector is disclosed, in particular for a computed tomography system. In an embodiment, the X-ray detector includes a regular arrangement of measuring pixels for covering a measuring surface. A plurality of the measuring pixels of the regular arrangement are constructed as direct converting measuring pixels, and remaining ones of the measuring pixels are constructed as indirect converting measuring pixels.
Claims23
An X-ray detector, comprising:
- a regular arrangement of measuring pixels covering a measuring surface, the regular arrangement including two different types of measuring pixels, wherein a plurality of the measuring pixels of the regular arrangement are constructed as direct converting measuring pixels and remaining ones of the measuring pixels are constructed as indirect converting measuring pixels, and wherein at least two adjacent of rows of measuring pixels are direct converting measuring pixels, a row being a plurality of measuring pixels adjacent to one another and extending along the entire measuring surface in a direction of rotation of the x-ray detector, wherein each direct converting measuring pixel includes a detector layer, and wherein the detector layer is provided with a reflective surface at least at boundary surfaces between direct converting measuring pixels and indirect converting measuring pixels.
Dependencies are inferred from the claim text.