Devices, systems, and methods for acquisition of an angular-dependent material feature

A method for measuring reflected light, the method comprising:

• obtaining a first light-measurement objective, wherein a light-measurement objective defines one or more of an intensity of emitted light, a spectrum of emitted light, a spectrum of detected light, and a reflectance angle of detected light;
• obtaining a second light-measurement objective;
• obtaining an angular-dependence objective, wherein the angular-dependence objective defines a difference between a first light-reflection angle and a second light-reflection angle;
• selecting first settings values for one or more first illumination-emission devices and one or more first illumination-detection devices based on the first light-measurement objective;
• selecting second settings values for one or more second illumination-emission devices and one or more second illumination-detection devices based on the second light-measurement objective;
• and
• selecting a speed of an object conveyor based on the angular-dependence objective.

A device for inspecting materials, the device comprising:

• a computer memory;
• and
• one or more processing units that are coupled to the computer memory, to an object conveyor that has an adjustable speed, to one or more illumination-emission devices, and to one or more illumination-detection devices, wherein the one or more processing units are configured to cause the device to
• obtain an angular-dependence objective, wherein the angular-dependence objective defines a difference between a first light-reflection angle and a second light-reflection angle;
• select a speed of the object conveyor based on the angular-dependence objective;
• initiate motion of the object conveyor at the speed;
• configure one or more first illumination-emission devices and one or more first illumination-detection devices according to first settings values;
• activate the one or more first illumination-emission devices;
• activate the one or more first illumination-detection devices to generate first illumination readings;
• configure one or more second illumination-emission devices and one or more second illumination-detection devices according to second settings values;
• activate the one or more second illumination-emission devices;
• and
• activate the one or more second illumination-detection devices to generate second illumination readings.