Direct conversion X-ray detector, CT system, and associated procedure
AssigneeSiemens Aktiengesellschaft
InventorsThorsten Ergler, Edgar Göderer, Björn Kreisler, Mario Reinwand, Christian Schröter
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AssigneeSiemens Aktiengesellschaft
InventorsThorsten Ergler, Edgar Göderer, Björn Kreisler, Mario Reinwand, Christian Schröter
Estimating the term…
A direct conversion X-ray detector for the detection of X-rays includes at least a semiconductor used for detecting X-rays, which has areas that are shaded against X-rays and unshaded areas, a pixelated electrode attached to the semiconductor and an all-over electrode attached to the semiconductor opposite the pixelated electrode, and at least one light source to illuminate the all-over electrode with additional light radiation for the purpose of generating additional charge carriers. In an embodiment, the at least one light source is designed such that the shaded areas are irradiated with a different intensity of the additional light radiation than are the unshaded areas. A CT system including the direct conversion X-ray detector is also disclosed, together with a method for the detection of incident X-rays via direct conversion X-ray detector, wherein the shaded areas are irradiated with a different intensity of the additional light radiation than the unshaded areas.
A direct conversion X-ray detector for the detection of X-rays, comprising:
A direct conversion X-ray detector for the detection of X-rays, comprising:
A method for the detection of incident X-rays via a direct conversion X-ray detector at least including a pixelated electrode attached to a semiconductor and an all-over electrode attached to the semiconductor opposite the pixelated electrode, wherein the semiconductor includes areas which are shaded against the X-rays and areas which are unshaded, the method comprising:
Dependencies are inferred from the claim text.