Systems and methods for improving pattern transfer

Abstract

Provided herein is a method of improving a transference of a mask pattern into a material layer on a semiconductor wafer. The method includes steps of receiving a semiconductor mask made from a desired design layout and of patterning the material layer present on a plurality of semiconductor wafers with the mask having the mask pattern and an illumination pattern. The method further includes steps of identifying defects and/or defect patterns in the transference of the mask pattern on the plurality of semiconductor wafers, determining an illumination modification, and applying the illumination modification to the illumination pattern to create a modified illumination pattern. Additional methods and associated systems are also provided.

Dependencies are inferred from the claim text.