Provision of etch stop for wordlines in a memory device
AssigneeIntel Corporation
InventorsGordon A. Haller, Jun Liu
Life of this patent
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AssigneeIntel Corporation
InventorsGordon A. Haller, Jun Liu
Estimating the term…
Embodiments of the present disclosure are directed towards techniques to provide etch stops to the wordlines that form a staircase structure of a 3D memory array. In one embodiment, the apparatus may comprise a 3D memory array having wordlines disposed in a staircase structure. A wordline may include a silicide layer and a spacer disposed to abut the silicide layer around an end of the wordline. The silicide layer and the spacer may form an etch stop of the wordline for a wordline contact structure to electrically connect the wordline with the memory array in response to a deposition of the wordline contact structure on the etch stop. The etch stop may be configured to prevent a physical or electrical contact of the wordline contact structure with an adjacent wordline of the staircase structure, in order to avoid undesired short circuits. Other embodiments may be described and/or claimed.
An apparatus, comprising:
An apparatus, comprising:
A method, comprising:
Dependencies are inferred from the claim text.