Metal-insulation-metal device

A metal-insulation-metal (MIM) device comprising:

• a first metal layer;
• a first insulation layer disposed on the first metal layer;
• a second metal layer disposed on a part of the first insulation layer;
• and
• a second insulation layer disposed on a side wall of the second metal layer and on another part of the first insulation layer;
• wherein a width of the first insulation layer under the second metal layer and the second insulation layer parallel to the first metal layer is greater than a width of the second metal layer parallel to the first metal layer, wherein the first insulation layer comprising a multilayer structure, and the multilayer structure comprises a first silicon dioxide sub-layer, a second silicon dioxide sub-layer and a silicon nitride sub-layer, wherein the first silicon dioxide sub-layer is disposed between the silicon nitride sub-layer and the first metal layer, the second silicon dioxide sub-layer is disposed between the silicon nitride sub-layer and the second metal layer, and the silicon nitride sub-layer is disposed between the first silicon dioxide sub-layer and the second silicon dioxide sub-layer, wherein a width of the first silicon dioxide sub-layer parallel to the first metal layer is greater than a width of the silicon nitride sub-layer parallel to the first metal layer, and the width of the silicon nitride sub-layer parallel to the first metal layer is greater than a width of the second silicon dioxide sub-layer parallel to the first metal layer.