Handling system for testing electronic components

A handling system for testing electronic components, comprising:

• an onloading station;
• a carrier system which is positionable next to the onloading station, the carrier system being configured to carry electronic components transferred from the onloading station, wherein the carrier system comprises a first buffer carrier for carrying a first array of a first plurality of electronic components and a second buffer carrier for carrying a second array of a second plurality of electronic components;
• a testing station which is configured for receiving the carrier system;
• and is configured to simultaneously test the first array of the first plurality of electronic components which have been arranged on the first buffer carrier of the carrier system while the second buffer carrier stands by at the testing station, the second buffer carrier proceeding for testing of the second array of the second plurality of electronic components at the testing station after the testing station completes testing of the first array of the first plurality of electronic components on the first buffer carrier;
• a rotary turret;
• and
• pick heads mounted on the rotary turret, each pick head being configured to hold a respective electronic component provided by the carrier system;
• wherein the pick heads are operative to remove electronic components from the first buffer carrier and the second buffer carrier after testing the same at the testing station;
• wherein the first array of the first plurality of electronic components are held by a first plurality of pick heads and the second array of the second plurality of electronic components are held by a second plurality of pick heads;
• wherein each of the first buffer carrier and the second buffer carrier is movable from a position of the rotary turret to a position of the testing station;
• and
• wherein each of the first buffer carrier and the second buffer carrier is movable at the same time from the position of the rotary turret to the position of the testing station.

A method for testing electronic components, comprising the steps of:

• providing electronic components from a supply source to pick heads mounted on a rotary turret, each pick head being configured to hold a respective electronic component;
• transferring a plurality of electronic components from the pick heads to a carrier system positioned adjacent to the rotary turret, wherein the carrier system comprises a first buffer carrier for carrying a first array of a first plurality of electronic components and a second buffer carrier for carrying a second array of a second plurality of electronic components;
• moving the first buffer carrier of the carrier system to a testing station for simultaneously testing the first array of the first plurality of electronic components which have been arranged on the first buffer carrier of the carrier system;
• testing the first array of the first plurality of electronic components on the first buffer carrier while the second buffer carrier stands by at the testing station, the second buffer carrier proceeding for testing of the second array of the second plurality of electronic components at the testing station after the testing station completes testing of the first array of the first plurality of electronic components on the first buffer carrier;
• and
• after testing the electronic components, removing the plurality of electronic components from the first buffer carrier and the second buffer carrier with the pick heads,
• wherein each of the first buffer carrier and the second buffer carrier is movable from a position of the rotary turret to a position of the testing station;
• wherein the first array of the first plurality of electronic components are held by a first plurality of pick heads and the second array of the second plurality of electronic components are held by a second plurality of pick heads;
• and
• wherein each of the first buffer carrier and the second buffer carrier is movable at the same time from the position of the rotary turret to the position of the testing station.