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US 9,518,959 B2Granted
Structural health monitoring system and method
AssigneeTexas Instruments Incorporated
InventorsRakesh Malladi, Anand G. Dabak, Nitish Krishna Murthy
Life of this patent
Estimating the term…
Abstract
A method includes: transmitting, via a signal generator, an electrical driving signal, the electrical driving signal having a mean square error; transmitting, via a wave generating component, a Lamb wave, the Lamb wave having many different modes; estimating, via an estimating component, a propagation parameter associated with the Lamb wave; and estimating, via an estimating component, a thickness of a material.
Claims20
A method comprising:
- providing, via a memory component, an initial thickness of a material to be monitored;
- providing, via a signal generator, an electrical driving signal;
- generating, via a wave generating component, a Lamb wave from the electrical driving signal;
- receiving, via a receiving component positioned a predetermined distance from the wave generating component, a received Lamb wave;
- generating, via the receiving component, an electrical received signal based on the received Lamb wave;
- estimating, via a first estimating component, a propagation parameter;
- and
- estimating, via a thickness estimating component, a new thickness of the material to be monitored based on the initial thickness and the estimated propagation parameter.
5 more elements
A device comprising:
- material having a thickness,
- a memory component operable to provide an initial thickness of said material;
- a signal generator operable to generate an electrical driving signal;
- a wave generating component operable to generate a Lamb wave from the electrical driving signal;
- a receiving component, positioned a predetermined distance from the wave generating component, operable to receive a received Lamb wave and to generate an electrical received signal based on the received Lamb wave;
- a first estimating component operable to estimate a propagation parameter;
- and
- a thickness estimating component operable to estimate a new thickness of said material based on the initial thickness and the estimated propagation parameter.
5 more elements
A device for use with a material having a thickness, said device comprising:
- a memory component operable to provide an initial thickness of the material;
- a signal generator operable to generate an electrical driving signal;
- a wave generating component operable to generate a Lamb wave from the electrical driving signal;
- a receiving component, positioned a predetermined distance from the wave generating component, operable to receive a received Lamb wave and to generate an electrical received signal based on the received Lamb wave;
- a first estimating component operable to estimate a propagation parameter;
- and
- a thickness estimating component operable to estimate a new thickness of the material based on the initial thickness and the estimated propagation parameter.
4 more elements
Dependencies are inferred from the claim text.