Probes for inspection system for substantially round hole
AssigneeGeneral Electric Company
InventorsRobert William Bergman, Thomas James Batzinger
Life of this patent
Estimating the term…
Abstract
Probes for an inspection system for a substantially round hole in a material are provided. One version of the probe may include a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; and a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole.
Claims19
A probe for an inspection system for a substantially round hole in a material, the probe comprising:
- a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole;
- a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole;
- a probe support coupled to the flexible sheet for supporting the flexible sheet relative to the substantially round hole;
- a handle coupled to the probe support for controlling a position of the probe;
- a guide support pivotally coupled to the handle at a first end of the guide support;
- a guide member coupled to a second end of the guide support for engaging an opposing portion of the interior of the substantially round hole from the flexible sheet;
- and
- a biasing element to bias the guide support to press the guide member against the opposing portion, the guide member movable with the flexible sheet and relative to the opposing portion to guide the flexible sheet along the portion.
A probe for an inspection system for a substantially round hole in a material, the probe comprising:
- an elongated sensor support;
- a bearing plate configured to rotatably support the elongated sensor support in a position in the substantially round hole;
- a sensor mount surface shaped to substantially conform with a portion of an interior of the substantially round hole;
- a plurality of sensors disposed on the sensor mount surface, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole;
- and
- a biasing element coupling the sensor mount surface and the elongated sensor support, the biasing element biasing the sensor mount surface to substantially conform with the portion of the interior of the substantially round hole.
Dependencies are inferred from the claim text.