Solid-state image sensor and image sensing system with different charge accumulation periods

A solid-state image sensor comprising:

• a plurality of pixels arranged to form a matrix, the pixels including at least a first pixel configured to detect light in a first wavelength range and a second pixel configured to detect light in a second wavelength range, the second wavelength range including a wavelength range on a longer-wavelength side than the first wavelength range,
• wherein each of the first pixel and the second pixel includes a photoelectric converter, a floating diffusion portion, a transfer transistor configured to transfer charges from the photoelectric converter to the floating diffusion portion, an amplifier transistor configured to output a signal corresponding to a potential of the floating diffusion portion, and a memory portion, and the first pixel and the second pixel belong to a same row,
• a first transfer control line configured to control the transfer transistor of the first pixel and a second transfer control line configured to control the transfer transistor of the second pixel are provided independently,
• the solid-state image sensor further comprises a control portion configured to supply a control signal to the transfer transistor such that a charge accumulation period of the first pixel is different from a charge accumulation period of the second pixel, and an output portion configured to output an image signal including a signal of the first pixel and a signal of the second pixel,
• wherein the control portion controls the first pixel and the second pixel to hold the signal of the first pixel in the memory portion of the first pixel until charge accumulation in the second pixel is finished, and the output portion outputs the image signal including the signal of the first pixel and the signal of the second pixel after the charge accumulation in the second pixel is finished.