Characterization of non-ASE noise on optical signals
AssigneeEXFO Inc.
InventorsGang He, Daniel Gariepy, Hongxin Chen, Bernard Ruchet
Life of this patent
Estimating the term…
Loading patent…
AssigneeEXFO Inc.
InventorsGang He, Daniel Gariepy, Hongxin Chen, Bernard Ruchet
Estimating the term…
There is provided a method for determining a noise parameter characterizing an optical Signal-Under-Test (SUT) having a signal contribution, an Amplified Spontaneous Emission (ASE) noise contribution and a non-ASE optical noise contribution, such as a carrier-leakage contribution or a depolarized-signal contribution, within an optical-signal bandwidth. The method comprises acquiring optical spectrum trace(s) of the SUT, discriminating at least the non-ASE optical noise contribution from the ASE-noise contribution using the optical spectrum trace(s) and/or a trace obtained from the optical spectrum trace(s); and determining the noise parameter using discriminated non-ASE optical noise contribution and/or the discriminated ASE-noise contribution.
A method for determining a noise parameter characterizing an optical signal-under-test having a signal contribution, an Amplified Spontaneous Emission (ASE) noise contribution and a non-ASE optical noise contribution within an optical-signal bandwidth, wherein said signal contribution is polarized and wherein said non-ASE optical noise contribution comprises a depolarized-signal contribution, said method comprising:
A method for determining a noise parameter characterizing an optical signal-under-test having a signal contribution, a carrier-leakage contribution and an Amplified Spontaneous Emission (ASE-) noise contribution within an optical-signal bandwidth, said method comprising:
Dependencies are inferred from the claim text.