Method for testing differential analog-to-digital converter and system therefor
AssigneeFreescale Semiconductor, Inc.
InventorsTao Chen, Douglas A. Garrity, Xiankun Jin
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AssigneeFreescale Semiconductor, Inc.
InventorsTao Chen, Douglas A. Garrity, Xiankun Jin
Estimating the term…
A method and circuit for testing an analog-to-digital converter (ADC) are provided. The method comprises: coupling a single-ended output of an analog signal source to a differential input of an amplifier; coupling a differential output of the amplifier to a differential input of the ADC; alternately providing first and second test signals from the single-ended output of the analog signal source to first and second input terminals of the differential input of the amplifier; amplifying the first and second test signals to generate amplified differential signals at the differential output of the amplifier; providing the amplified differential signals to the differential input of the ADC; and determining if an output of the ADC is as expected. An offset may also be provided to the differential output of the amplifier. The method allows an ADC having a differential input to be tested using a digital-to-analog converter (DAC) having a single-ended output.
A method for testing an analog-to-digital converter (ADC), the method comprising:
A method for testing an analog-to-digital converter (ADC), the method comprising:
A differential amplifier stage comprising:
Dependencies are inferred from the claim text.